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cond-mat.mtrl-sci2012★ 20 cited
Analysis of periodic Mo/Si multilayers: influence of the Mo thickness
H. Maury, Jean-Michel André, Karine Le Guen +6
A set of Mo/Si periodic multilayers is studied by non destructive analysis methods. The thickness of the Si layers is 5 nm while the thickness of the Mo layers changes from one mul…
physics.ins-det2012★ 10 cited
An etched multilayer as a dispersive element in a curved-crystal spectrometer: implementation and performance
Philippe Jonnard, Karine Le Guen, Jean-Michel André +2
Etched multilayers obtained by forming a laminar grating pattern within interferential multilayer mirrors are used in the soft x-ray range to improve the spectral resolution of wav…