activity
20122018
most citedAnalysis of periodic Mo/Si multilayers: influence of the Mo thickness

20 citations · 54 across the 5 of their papers we have counts for

collaborators

5 papers

physics.app-ph2018★ 10 cited

Characterization of Pd/Y multilayers with B4C barrier layers using GIXR and x-ray standing wave enhanced HAXPES

M. Y. Wu, Q. S. Huang, K. Le Guen +6

Pd/Y multilayers are high reflectance mirrors designed to work in the 7.5-11 nm wavelength range. Samples, prepared by magnetron sputtering, are deposited with or without B4C barri…

physics.ins-det2013★ 10 cited

High-resolution x-ray analysis with multilayer gratings

Philippe Jonnard, Karine Le Guen, Jean-Michel André

Periodic multilayers are nowadays widely used to perform x-ray analysis in the soft x-ray range (photon energy lower than 1 keV). However, they do not permit to obtain high-resolut…

cond-mat.mtrl-sci2013★ 4 cited

Determination of the magnetization profile of Co/Mg periodic multilayers by magneto-optic Kerr effect and X-ray magnetic resonant reflectivity

Philippe Jonnard, K. Le Guen, Jean-Michel André +8

The resonant magnetic reflectivity of Co/Mg multilayers around the Co L2,3 absorption edge is simulated then measured on a specifically designed sample. The dichroic signal is obta…

cond-mat.mtrl-sci2012★ 20 cited

Analysis of periodic Mo/Si multilayers: influence of the Mo thickness

H. Maury, Jean-Michel André, Karine Le Guen +6

A set of Mo/Si periodic multilayers is studied by non destructive analysis methods. The thickness of the Si layers is 5 nm while the thickness of the Mo layers changes from one mul…

physics.ins-det2012★ 10 cited

An etched multilayer as a dispersive element in a curved-crystal spectrometer: implementation and performance

Philippe Jonnard, Karine Le Guen, Jean-Michel André +2

Etched multilayers obtained by forming a laminar grating pattern within interferential multilayer mirrors are used in the soft x-ray range to improve the spectral resolution of wav…