22 citations · 24 across the 8 of their papers we have counts for
4 papers · 1 filter
Enthalpy of formation for Cu-Zn-Sn-S (CZTS)
Sergey V. Baryshev, Elijah Thimsen
Herein we report an analytical procedure to calculate the enthalpy of formation for thin film multinary compounds from sputtering rates measured during ion bombardment. The method…
Supporting Information for Enthalpy of formation for Cu-Zn-Sn-S (CZTS)
Sergey V. Baryshev, Elijah Thimsen
This is Supporting Information for Enthalpy of formation for Cu-Zn-Sn-S (CZTS)
High resolution SIMS depth profiling of nanolayers
S. V. Baryshev, A. V. Zinovev, C. E. Tripa +4
We report results of high-resolution TOF SIMS (time of flight secondary ion mass spectrometry) depth profiling experiments on a nanolayered structure, a stack of 16 alternating MgO…
White Light Interferometry for Quantitative Surface Characterization in Ion Sputtering Experiments
S. V. Baryshev, A. V. Zinovev, C. E. Tripa +2
White light interferometry (WLI) can be used to obtain surface morphology information on dimensional scale of millimeters with lateral resolution as good as ~1 μm and depth resolut…