most citedWhite Light Interferometry for Quantitative Surface Characterization in Ion Sputtering Experiments

22 citations · 24 across the 5 of their papers we have counts for

collaborators

5 papers

physics.acc-ph2014

Planar Ultrananocrystalline Diamond Field Emitter in Accelerator RF Electron Injector: Performance Metrics

Sergey V. Baryshev, Sergey Antipov, Jiahang Shao +7

A case performance study of a planar field emission cathode (FEC) based on nitrogen-incorporated ultrananocrystalline diamond, (N)UNCD, was carried out in an RF 1.3 GHz electron gu…

cond-mat.mtrl-sci20142 cited

Enthalpy of formation for Cu-Zn-Sn-S (CZTS)

Sergey V. Baryshev, Elijah Thimsen

Herein we report an analytical procedure to calculate the enthalpy of formation for thin film multinary compounds from sputtering rates measured during ion bombardment. The method…

cond-mat.mtrl-sci2014

Supporting Information for Enthalpy of formation for Cu-Zn-Sn-S (CZTS)

Sergey V. Baryshev, Elijah Thimsen

This is Supporting Information for Enthalpy of formation for Cu-Zn-Sn-S (CZTS)

cond-mat.mtrl-sci2012

High resolution SIMS depth profiling of nanolayers

S. V. Baryshev, A. V. Zinovev, C. E. Tripa +4

We report results of high-resolution TOF SIMS (time of flight secondary ion mass spectrometry) depth profiling experiments on a nanolayered structure, a stack of 16 alternating MgO…

cond-mat.mtrl-sci201222 cited

White Light Interferometry for Quantitative Surface Characterization in Ion Sputtering Experiments

S. V. Baryshev, A. V. Zinovev, C. E. Tripa +2

White light interferometry (WLI) can be used to obtain surface morphology information on dimensional scale of millimeters with lateral resolution as good as ~1 μm and depth resolut…