Universal Tc depression by irradiation defects in underdoped and overdoped cuprates

F. Rullier-Albenque, P. A. Vieillefond, H. Alloul +3

We report on a study of the influence of defects introduced in the CuO${}_2$ planes of cuprates in a wide range of hole dopings n. T${}_c$ and electrical resistivity $\rho (T)$ measure…