most citedInfrared Imaging of the Nanometer-Thick Accumulation Layer in Organic Field-Effect Transistors

56 citations · 56 across the 1 of their papers we have counts for

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cond-mat.soft2006★ 56 cited

Infrared Imaging of the Nanometer-Thick Accumulation Layer in Organic Field-Effect Transistors

Z. Q. Li, G. M. Wang, N. Sai +5

We report on infrared (IR) spectro-microscopy of the electronic excitations in nanometer-thick accumulation layers in FET devices based on poly(3-hexylthiophene). IR data allows us…