2 papers
cs.AR2007
Worst-Case and Average-Case Analysis of n-Detection Test Sets
Irith Pomeranz, Sudhakar M. Reddy
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform b…
cs.OH2007
The Accidental Detection Index as a Fault Ordering Heuristic for Full-Scan Circuits
Irith Pomeranz, Sudhakar M. Reddy
We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI (…