most citedUnusual ultralow frequency fluctuations in freestanding graphene

100 citations · 246 across the 12 of their papers we have counts for

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cond-mat.mes-hall2015★ 28 cited

Electronic transition from graphite to graphene via controlled movement of the top layer with scanning tunneling microscopy

P. Xu, Y. Yang, D. Qi +5

A series of measurements using a technique called electrostatic-manipulation scanning tunneling microscopy (EM-STM) were performed on a highly-oriented pyrolytic graphite surface.…

cond-mat.mes-hall2015

New Scanning Tunneling Microscopy Technique Enables Systematic Study of the Unique Electronic Transition from Graphite to Graphene

P. Xu, Y. Yang, S. D. Barber +5

A series of measurements using a novel technique called electrostatic-manipulation scanning tunneling microscopy were performed on a highly-oriented pyrolytic graphite (HOPG) surfa…

cond-mat.mes-hall2015★ 5 cited

Graphene Manipulation on 4H-SiC(0001) Using Scanning Tunneling Microscopy

P. Xu, M. L. Ackerman, S. D. Barber +8

Atomic-scale topography of epitaxial multilayer graphene grown on 4H-SiC(0001) was investigated using scanning tunneling microscopy (STM). Bunched nano-ridges ten times smaller tha…

cond-mat.mes-hall2015

Atomic-Scale Movement Induced in Nano-Ridges by Scanning Tunneling Microscopy on Epitaxial Graphene Grown on 4H-SiC(0001)

P. Xu, S. D. Barber, J. K. Schoelz +8

Nanoscale ridges in epitaxial multilayer graphene grown on the silicon face of 4 degree off-cut 4H-SiC (0001) were found using scanning tunneling microscopy (STM). These nano-ridge…

cond-mat.mes-hall2015

Role of bias voltage and tunneling current in the perpendicular displacements of freestanding graphene via scanning tunneling microscopy

P. Xu, S. D. Barber, M. L. Ackerman +2

Systematic displacement measurements of freestanding graphene as a function of applied bias voltage and tunneling current setpoint using scanning tunneling microscopy (STM) are pre…

cond-mat.mes-hall2015

Etch-stop method for reliably fabricating sharp yet mechanically stable scanning tunneling microscope tips

G. Basnet, J. K. Schoelz, P. Xu +3

An extension of the direct-current, double-lamella drop-off technique for electrochemically etching tungsten scanning-tunneling-microscope tips is presented. The key fabrication st…