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cond-mat.mtrl-sci2025
Computation and Sensitivity Analysis of the Deformation-Gradient Tensor Reconstruction in Dark-Field X-ray Microscopy
Brinthan Kanesalingam, Darshan Chalise, Carsten Detlefs +1
Spatially resolved strain measurements are crucial to understanding the properties of engineering materials. Although strain measurements utilizing techniques such as transmission…
cond-mat.mtrl-sci2024
X-ray induced grain boundary formation and grain rotation in Bi2Se3
Kento Katagiri, Bernard Kozioziemski, Eric Folsom +24
Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, in…
cond-mat.mtrl-sci2024
Formalism to Image the Dynamics of Coherent and Incoherent Phonon with Dark-Field X-ray Microscopy using Kinematic Diffraction Theory
Darshan Chalise, Yifan Wang, Mariano Trigo +1
Dark-field X-ray microscopy (DFXM) is a novel X-ray imaging technique developed at synchrotrons to image along the diffracted beam with a real space resolution of ~100 nm and recip…