5 papers
Dynamical diffraction formalism for imaging time-dependent diffuse scattering from coherent phonons with Dark-Field X-ray Microscopy
Darshan Chalise, Brinthan Kanesalingam, Dorian P. Luccioni +3
Coherent acoustic phonons, whose damping sets the upper bound of quality factors in acoustic resonators, play a critical role in advanced telecommunication and quantum information…
Computation and Sensitivity Analysis of the Deformation-Gradient Tensor Reconstruction in Dark-Field X-ray Microscopy
Brinthan Kanesalingam, Darshan Chalise, Carsten Detlefs +1
Spatially resolved strain measurements are crucial to understanding the properties of engineering materials. Although strain measurements utilizing techniques such as transmission…
Planar 3 and 2 Method for Increased Sensitivity to Through-Plane Thermal Properties
Darshan Chalise, Brinthan Kanesalingam, Divya Chalise
Accurately measuring the thermal properties of buried interfaces is crucial for understanding heat transport in multilayered materials, particularly in applications such as batteri…
X-ray induced grain boundary formation and grain rotation in Bi2Se3
Kento Katagiri, Bernard Kozioziemski, Eric Folsom +24
Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, in…
Formalism to Image the Dynamics of Coherent and Incoherent Phonon with Dark-Field X-ray Microscopy using Kinematic Diffraction Theory
Darshan Chalise, Yifan Wang, Mariano Trigo +1
Dark-field X-ray microscopy (DFXM) is a novel X-ray imaging technique developed at synchrotrons to image along the diffracted beam with a real space resolution of ~100 nm and recip…