most citedNanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry

54 citations · 127 across the 3 of their papers we have counts for

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physics.ins-det2015★ 54 cited

Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry

Nico Klingner, René Heller, Gregor Hlawacek +4

Time of flight backscattering spectrometry (ToF-BS) was successfully implemented in a helium ion microscope (HIM). Its integration introduces the ability to perform laterally resol…

physics.ins-det2015★ 22 cited

Sub-pixel resolution with color X-ray camera SLcam(R)

Stanisław H. Nowak, Aniouar Bjeoumikhov, Johannes von Borany +8

The color X-ray camera SLcam(R) is a full-field, single photon detector providing scanning free, energy and spatially resolved X-ray imaging. Spatial resolution is achieved with th…