54 citations · 127 across the 3 of their papers we have counts for
3 papers
Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry
Nico Klingner, René Heller, Gregor Hlawacek +4
Time of flight backscattering spectrometry (ToF-BS) was successfully implemented in a helium ion microscope (HIM). Its integration introduces the ability to perform laterally resol…
Sub-pixel resolution with color X-ray camera SLcam(R)
Stanisław H. Nowak, Aniouar Bjeoumikhov, Johannes von Borany +8
The color X-ray camera SLcam(R) is a full-field, single photon detector providing scanning free, energy and spatially resolved X-ray imaging. Spatial resolution is achieved with th…
GaMnN epitaxial films with high magnetization
Gerd Kunert, Sylwia Dobkowska, Tian Li +10
We report on the fabrication of pseudomorphic wurtzite GaMnN grown on GaN with Mn concentrations up to 10% using molecular beam epitaxy. According to Rutherford backscattering the…