21 citations · 66 across the 10 of their papers we have counts for
Showing 2016 · cs.ITShow all
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cs.IT2016
Duality between erasures and defects
Yongjune Kim, B. V. K. Vijaya Kumar
We investigate the duality of the binary erasure channel (BEC) and the binary defect channel (BDC). This duality holds for channel capacities, capacity achieving schemes, minimum d…
cs.IT2016★ 3 cited
Locally rewritable codes for resistive memories
Yongjune Kim, Abhishek A. Sharma, Robert Mateescu +4
We propose locally rewritable codes (LWC) for resistive memories inspired by locally repairable codes (LRC) for distributed storage systems. Small values of repair locality of LRC…