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20132016
most citedCoding for Memory with Stuck-at Defects

21 citations · 66 across the 10 of their papers we have counts for

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Showing cs.ITShow all

8 papers · 1 filter

cs.IT2016

Duality between erasures and defects

Yongjune Kim, B. V. K. Vijaya Kumar

We investigate the duality of the binary erasure channel (BEC) and the binary defect channel (BDC). This duality holds for channel capacities, capacity achieving schemes, minimum d…

cs.IT2016★ 3 cited

Locally rewritable codes for resistive memories

Yongjune Kim, Abhishek A. Sharma, Robert Mateescu +4

We propose locally rewritable codes (LWC) for resistive memories inspired by locally repairable codes (LRC) for distributed storage systems. Small values of repair locality of LRC…

cs.IT2014★ 9 cited

Writing on dirty flash memory

Yongjune Kim, B. V. K. Vijaya Kumar

The most important challenge in the scaling down of flash memory is its increased inter-cell interference (ICI). If side information about ICI is known to the encoder, the flash me…

cs.IT2014★ 15 cited

Coding scheme for 3D vertical flash memory

Yongjune Kim, Robert Mateescu, Seung-Hwan Song +2

Recently introduced 3D vertical flash memory is expected to be a disruptive technology since it overcomes scaling challenges of conventional 2D planar flash memory by stacking up c…

cs.IT2014★ 1 cited

On the Duality of Erasures and Defects

Yongjune Kim, B V K Vijaya Kumar

In this paper, the duality of erasures and defects will be investigated by comparing the binary erasure channel (BEC) and the binary defect channel (BDC). The duality holds for cha…

cs.IT2013★ 3 cited

Redundancy Allocation of Partitioned Linear Block Codes

Yongjune Kim, B. V. K. Vijaya Kumar

Most memories suffer from both permanent defects and intermittent random errors. The partitioned linear block codes (PLBC) were proposed by Heegard to efficiently mask stuck-at def…

cs.IT2013★ 21 cited

Coding for Memory with Stuck-at Defects

Yongjune Kim, B. V. K. Vijaya Kumar

In this paper, we propose an encoding scheme for partitioned linear block codes (PLBC) which mask the stuck-at defects in memories. In addition, we derive an upper bound and the es…

cs.IT2013★ 2 cited

Modulation Coding for Flash Memories

Yongjune Kim, Kyoung Lae Cho, Hongrak Son +4

The aggressive scaling down of flash memories has threatened data reliability since the scaling down of cell sizes gives rise to more serious degradation mechanisms such as cell-to…