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physics.optics2022★ 25 cited
Optical Fingerprint of Flat Substrate Surface and Marker-free Lateral Displacement Detection with Angstrom-level Precision
Shupei Lin, Yong He, Delong Feng +2
We report that flat substrates such as glass coverslips with surface roughness well below 0.5 nm feature notable speckle patterns when observed with high-sensitivity interference m…
physics.optics2020★ 16 cited
Multiscale Modeling and Analysis for High-fidelity Interferometric Scattering Microscopy
Shupei Lin, Yong He, Hadrien Marc Louis Robert +4
Interferometric scattering microscopy (iSCAT), as an ultrasensitive fluorescence-free imaging modality, has recently gain enormous attention and been rapidly developing from demons…