Multiscale Modeling and Analysis for High-fidelity Interferometric Scattering Microscopy
arXiv:2004.10575 · doi:10.1088/1361-6463/abf70d
Abstract
Interferometric scattering microscopy (iSCAT), as an ultrasensitive fluorescence-free imaging modality, has recently gain enormous attention and been rapidly developing from demonstration of principle to quantitative sensing. Here we report on a theoretical and experimental study for iSCAT with samples having structural dimensions that differ by 4-5 orders of magnitude. In particular, we demonstrate and intuitively explain the profound effects of sub-nanometer surface roughness of a glass coverslip and of a mica surface on the absolute signal and the shape of the point spread function of a gold nanoparticle. These quantities significantly affect the accuracies for determining the target size and position in all three dimensions. Moreover, we investigate a sample system mimicking a gold nanoparticle in a simplified cell environment and show position-dependent and even asymmetric point spread function of the nanoparticle. The multiscale study will facilitate the development of high fidelity iSCAT in real applications.
arXiv commentExpanded the discussion on the effect of surface roughness
References in corpus (7)
- Direct optical sensing of single unlabeled small proteins and super-resolution microscopy of their binding sites
- Near-to-far field transformations for radiative and guided waves
- Imaging material functionality through 3D nanoscale tracking of energy flow
- Tracking single particles on supported lipid membranes: multi-mobility diffusion and nanoscopic confinement
- Light Microscopy: An ongoing contemporary revolution
- The point spread function in interferometric scattering microscopy (iSCAT). I. Aberrations in defocusing and axial localization
- BGnet: Accurate and rapid background estimation in single-molecule localization microscopy with deep neural nets
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