activity
20102014
most citedRevealing the electronic band structure of trilayer graphene on SiC: An angle-resolved photoemission study

86 citations · 115 across the 6 of their papers we have counts for

collaborators

6 papers

cond-mat.mtrl-sci2014★ 86 cited

Revealing the electronic band structure of trilayer graphene on SiC: An angle-resolved photoemission study

Camilla Coletti, Stiven Forti, Alessandro Principi +10

In recent times, trilayer graphene has attracted wide attention owing to its stacking and electric field dependent electronic properties. However, a direct and well-resolved experi…

cond-mat.mtrl-sci2012

Molecular Gas Adsorption Induced Carrier Transport Studies of Epitaxial Graphene using IR Reflection Spectroscopy

B. K. Daas, W. K. Nomani, K. M. Daniels +3

We investigate molecular adsorption doping by electron withdrawing NO2 and electron donating NH3 on epitaxial graphene grown on C-face SiC substrates. Amperometric measurements sho…

physics.plasm-ph2010★ 3 cited

Polariton Enhanced IR Reflection Spectra of Epitaxial Graphene on SiC

B. K. Daas, K. M. Daniels, T. S. Sudarshan +1

We show ~10x polariton-enhanced infrared reflectivity of epitaxial graphene on 4H-SiC, in SiC's restrahlen band (8-10um). By fitting measurements to theory, we extract the thicknes…

physics.chem-ph2010★ 4 cited

Graphene to Graphane: Novel Electrochemical Conversion

Kevin M. Daniels, B. Daas, R. Zhang +6

A novel electrochemical means to generate atomic hydrogen, simplifying the synthesis and controllability of graphane formation on graphene is presented. High quality, vacuum grown…

cond-mat.mtrl-sci2010★ 1 cited

Effect of crystallographic dislocations on the reverse performance of 4H-SiC p-n diodes

Feng Zhao, Mohammad M. Islam, Biplob K. Daas +1

A quantitative study was performed to investigate the impact of crystallographic dislocation defects, 21 including screw dislocation, basal plane dislocation, and threading edge di…

cond-mat.mtrl-sci2010★ 21 cited

Doping Dependence of Thermal Oxidation on n-type 4H-SiC

B. K. Daas, M. M. Islam, I. A. Chowdhury +3

The doping dependence of dry thermal oxidation rates in n-type 4H-SiC was investigated. The oxidation was performed in the temperature range 1000C to 1200C for samples with nitroge…