8 citations · 14 across the 7 of their papers we have counts for
7 papers
Sensitivity Improvement by Sample Vibration Excitation in Resistivity Measurement for Non-Magnetic Material Using MFM
Kazuma Okamoto, Takumi Imura, Naruto Nakamura +4
A novel approach for measuring the electrical resistivity of non-magnetic materials using magnetic force microscopy (MFM) is discussed. In this method, MFM detects magnetic fields…
Monochromatic Electron Emission from Graphene-Insulator-Semiconductor-Structured Electron Source Utilizing Interference Efficets
Takao Koichi, Shogo Kawashima, Hiroshi Miyake +4
The graphene-insulator-semiconductor-structured electron source has garnered significant attention due to its high electron emission efficiency and highly monochromatic electron em…
Resistivity measurement for non-magnetic materials using high-order resonance mode of mfm-cantilever oscillation
Kazuma Okamoto, Takumi Imura, Satoshi Abo +3
A method to measure the electrical resistivity of materials using magnetic-force microscopy (MFM) is discussed, where MFM detects the magnetic field caused by the tip-oscillation-i…
Detection of nonmagnetic metal thin film using magnetic force microscopy
Fujio Wakaya, Kenta Oosawa, Masahiro Kajiwara +2
Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a the…
Maskless laser processing of graphene
Fujio Wakaya, Tadashi Kurihara, Nariaki Yurugi +3
Graphene on a SiO/Si substrate was removed by ultraviolet pulsed laser irradiation. Threshold laser power density to remove graphene depended on the graphene thickness. The mec…
Characterization of X-ray charge neutralizer using carbon-nanotube field emitter
Shuhei Okawaki, Satoshi Abo, Fujio Wakaya +3
An X-ray charge neutralizer using a screen-printed carbon-nanotube field emitter is demonstrated to show the possibility of a large-area flat-panel charge neutralizer, although the…