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cond-mat.mtrl-sci2012★ 3 cited
Sub micron-precision sample holder for accurate re-positioning of samples in Scanning Force Microscopy
José Abad, Juan Francisco González Martínez, Jaime Colchero Paetz
Scanning Probe Microscopy allows for extreme resolution down to the atomic scale. Unfortunately, total scanning range is rather limited, therefore finding a specific position on th…
cond-mat.mtrl-sci2011
Nanoscale measurement of the Power Spectral Density of surface roughness: a difficult experimental challenge and how to solve it
Juan Francisco González Martínez, Inés Nieto Carvajal, José Abad +1
In the present work we show that the correct determination of surface morphology using Scanning Force Microscopy (SFM) imaging and Power Spectral Density (PSD) analysis of the surf…