Characterization of silicon thin overlayers on rutile \ce{TiO2} (110)-(1x1)

J. Abad, C. Gonzalez, P. L. de Andres +1

Silicon thin films for coverages ($\theta$) between 0.3 and 3 monolayers have been grown on rutile \ce{TiO2}(110)-(1x1) at room temperature and studied by x-ray and ultra-violet photoel…