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eess.IV2023★ 13 cited
Accelerated deep self-supervised ptycho-laminography for three-dimensional nanoscale imaging of integrated circuits
Iksung Kang, Yi Jiang, Mirko Holler +5
Three-dimensional inspection of nanostructures such as integrated circuits is important for security and reliability assurance. Two scanning operations are required: ptychographic…
eess.IV2022★ 10 cited
Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time
Iksung Kang, Ziling Wu, Yi Jiang +5
Noninvasive X-ray imaging of nanoscale three-dimensional objects, e.g. integrated circuits (ICs), generally requires two types of scanning: ptychographic, which is translational an…