most citedHigh-Resolution Short-Circuit Fault Localization in a Multi-Layer Integrated Circuit using a Quantum Diamond Microscope

15 citations · 15 across the 1 of their papers we have counts for

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1 paper

physics.ins-det2023★ 15 cited

High-Resolution Short-Circuit Fault Localization in a Multi-Layer Integrated Circuit using a Quantum Diamond Microscope

P. Kehayias, J. Walraven, A. L. Rodarte +1

As integrated circuit (IC) geometry and packaging become more sophisticated with ongoing fabrication and design innovations, the electrical engineering community needs increasingly…