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Christopher Allen Grome

2 papers hereh-index 227 citations2 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • first author1

Across the 1 of 2 papers where every author was matched, so the position is known.

fields
  • physics.app-ph1
  • physics.ins-det1

identity via Semantic Scholar / OpenAlex

most citedA Brief Review of Single Event Burnout Failure Mechanisms and Design Tolerances of Silicon Carbide MOSFETs

25 citations · 25 across the 2 of their papers we have counts for

collaborators

2 papers

physics.ins-det2023★ 25 cited

A Brief Review of Single Event Burnout Failure Mechanisms and Design Tolerances of Silicon Carbide MOSFETs

Christopher A. Grome, Wei Ji

Radiation hardening of the MOSFET is of the highest priority for sustaining high-power systems in the space radiation environment. SiC-based power electronics are being looked at a…

physics.app-ph2023

Negative thermal expansion coefficient and amorphization in defective 4H-SiC

Christopher Allen Grome

Silicon Carbide (SiC) is a wide bandgap semiconductor material recently being used in replacement of traditional semiconductors for high-voltage power device applications. Radiatio…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.