most citedFlux-trapping characterization for superconducting electronics using a cryogenic widefield N- diamond microscope

3 citations · 3 across the 1 of their papers we have counts for

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1 paper

cond-mat.supr-con2026★ 3 cited

Flux-trapping characterization for superconducting electronics using a cryogenic widefield N- diamond microscope

Rohan T. Kapur, Pauli Kehayias, Sergey K. Tolpygo +12

Magnetic flux trapping is a significant hurdle limiting the reliability and scalability of superconducting electronics, yet tools for imaging flux vortices remain slow or insensiti…