3 papers
cond-mat.supr-con2026
Flux-trapping characterization for superconducting electronics using a cryogenic widefield N- diamond microscope
Rohan T. Kapur, Pauli Kehayias, Sergey K. Tolpygo +12
Magnetic flux trapping is a significant hurdle limiting the reliability and scalability of superconducting electronics, yet tools for imaging flux vortices remain slow or insensiti…
cond-mat.supr-con2025
Fabrication and Properties of NbN/NbNx/NbN and Nb/NbNx/Nb Josephson Junctions
Sergey K. Tolpygo, Ravi Rastogi, David Kim +3
Increasing integration scale of superconductor electronics (SCE) requires employing kinetic inductors and self-shunted Josephson junctions (JJs) for miniaturizing inductors and JJs…
cond-mat.supr-con2025
Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions
Evan B. Golden, Neel A. Parmar, Vasili K. Semenov +1
A variety of superconductor integrated circuits comprising six ac-powered SFQ shift registers with a total of 27078 bits and 108500 Josephson junctions (JJs) per 5 mm x 5 mm chip h…