3 papers
cond-mat.mes-hall2018
Lagrangian and impedance spectroscopy treatments of electric force microscopy
Ryan P. Dwyer, Lee E. Harrell, John A. Marohn
Scanning probe microscopy is often extended beyond topographic imaging to study electrical forces and sample properties, with the most widely used experiment being frequency-modula…
physics.ins-det2002
170 Nanometer Nuclear Magnetic Resonance Imaging using Magnetic Resonance Force Microscopy
Kent R. Thurber, Lee E. Harrell, Doran D. Smith
We demonstrate one-dimensional nuclear magnetic resonance imaging of the semiconductor GaAs with 170 nanometer slice separation and resolve two regions of reduced nuclear spin pola…
physics.ins-det2002
Temperature measurement at the end of a cantilever using oxygen paramagnetism in solid air
Kent R. Thurber, Lee E. Harrell, Doran D. Smith
We demonstrate temperature measurement of a sample attached to the end of a cantilever using cantilever magnetometry of solid air ``contamination'' of the sample surface. In experi…