280 citations · 320 across the 6 of their papers we have counts for
4 papers · 1 filter
Simultaneous imaging of dopants and free charge carriers by STEM-EELS
Hongbin Yang, Andrea Konečná, Xianghan Xu +4
Doping inhomogeneities in solids are not uncommon, but their microscopic observation and understanding are limited due to the lack of bulk-sensitive experimental techniques with hi…
Electronic structure of Humble defects in Ge and GeSi
Shang Ren, Hongbin Yang, Sobhit Singh +3
The group-IV diamond-structure elements are known to host a variety of planar defects, including {001} planar defects in C and {001}, {111} and {113} planar defects in Si and Ge. A…
Humble planar defects in SiGe nanopillars
Hongbin Yang, Shang Ren, Sobhit Singh +5
We report a new \{001\} planar defect found in SiGe nanopillars. The defect structure, determined by atomic resolution electron microscopy, matches the Humble defect model proposed…
Instability, Intermixing and Electronic Structure at the Epitaxial LaAlO3/SrTiO3(001) Heterojunction
S. A. Chambers, M. H. Engelhard, V. Shutthanandan +11
The question of stability against diffusional mixing at the prototypical LaAlO3/SrTiO3(001) interface is explored using a multi-faceted experimental and theoretical approach. We co…