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cond-mat.mtrl-sci2024
Towards atom counting from first moment STEM images: methodology and possibilities
Yansong Hao, Annick De Backer, Scott David Findlay +1
Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) imag…
cond-mat.mtrl-sci2021
Procedure for 3D atomic resolution reconstructions using atom-counting and a Bayesian genetic algorithm
Annick De Backer, Sandra Van Aert, Peter D. Nellist +1
We introduce a Bayesian genetic algorithm for reconstructing atomic models of nanoparticles from a single projection using Z-contrast imaging. The number of atoms in a projected at…