5 citations · 5 across the 3 of their papers we have counts for
3 papers
Towards atom counting from first moment STEM images: methodology and possibilities
Yansong Hao, Annick De Backer, Scott David Findlay +1
Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) imag…
Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions
Zezhong Zhang, Ivan Lobato, Annick De Backer +2
Advanced materials often consist of multiple elements which are arranged in a complicated structure. Quantitative scanning transmission electron microscopy is useful to determine t…
Procedure for 3D atomic resolution reconstructions using atom-counting and a Bayesian genetic algorithm
Annick De Backer, Sandra Van Aert, Peter D. Nellist +1
We introduce a Bayesian genetic algorithm for reconstructing atomic models of nanoparticles from a single projection using Z-contrast imaging. The number of atoms in a projected at…