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Magnetic and chemical nonuniformity in Ga[1-x]Mn[x]As films as probed by polarized neutron and x-ray reflectometry
B. J. Kirby, J. A. Borchers, J. J. Rhyne +9
We have used complementary neutron and x-ray reflectivity techniques to examine the depth profiles of a series of as-grown and annealed Ga[1-x]Mn[x]As thin films. A magnetization g…
Effects of Capping on the (Ga,Mn)As Magnetic Depth Profile
B. J. Kirby, J. A. Borchers, J. J. Rhyne +6
Annealing can increase the Curie temperature and net magnetization in uncapped (Ga,Mn)As films, effects that are suppressed when the films are capped with GaAs. Previous polarized…
Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As
B. J. Kirby, J. A. Borchers, J. J. Rhyne +7
We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga[1-x]Mn[x]As films using polarized neutron reflectometry. In addition to…