most citedMicroscopic thickness determination of thin graphite films formed on SiC from quantized oscillation in reflectivity of low-energy electrons

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cond-mat.mtrl-sci2007★ 363 cited

Microscopic thickness determination of thin graphite films formed on SiC from quantized oscillation in reflectivity of low-energy electrons

H. Hibino, H. Kageshima, F. Maeda +3

Low-energy electron microscopy (LEEM) was used to measure the reflectivity of low-energy electrons from graphitized SiC(0001). The reflectivity shows distinct quantized oscillation…