140 citations · 660 across the 15 of their papers we have counts for
4 papers · 2 filters
Crosstalk Correction in Atomic Force Microscopy
A. Hoffmann, T. Jungk, E. Soergel
Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to mea…
Influence of the inhomogeneous field at the tip on quantitative piezoresponse force microscopy
T. Jungk, A. Hoffmann, E. Soergel
Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to mechanical deformations…
Detection mechanism for ferroelectric domain boundaries with lateral force microscopy
T. Jungk, A. Hoffmann, E. Soergel
The contrast mechanism for the visualization of ferroelectric domain boundaries with lateral force microscopy is generally assumed to be caused by mechanical deformation of the sam…
Impact of elasticity on the piezoresponse of adjacent ferroelectric domains investigated by scanning force microscopy
Tobias Jungk, Akos Hoffmann, Elisabeth Soergel
As a consequence of elasticity, mechanical deformations of crystals occur on a length scale comparable to their thickness. This is exemplified by applying a homogeneous electric fi…