14 citations · 19 across the 3 of their papers we have counts for
Showing cond-mat.mes-hallShow all
2 papers · 1 filter
cond-mat.mes-hall2023★ 14 cited
Detection and modeling of hole capture by single point defects under variable electric fields
Artur Lozovoi, YunHeng Chen, Gyorgy Vizkelethy +4
Understanding carrier trapping in solids has proven key to semiconductor technologies but observations thus far have relied on ensembles of point defects, where the impact of neigh…
cond-mat.mes-hall2023★ 5 cited
Semiempirical modeling of bound states of deep defects in semiconductor quantum technologies
YunHeng Chen, Lachlan Oberg, Johannes Flick +3
A significant hurdle in developing high-performance semiconductor quantum technologies utilizing deep defects is related to charge dynamics. Unfortunately, progress in modeling the…