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20082026
most citedCritical thickness and orbital ordering in ultrathin La0.7Sr0.3MnO3 films

422 citations · 459 across the 13 of their papers we have counts for

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cond-mat.mtrl-sci2014★ 29 cited

Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

J. Schaab, I. P. Krug, F. Nickel +9

High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application…