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researcher

Y. Ando

61 papers hereh-index 272.1k citations163 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • first author8
  • middle author44
  • last author1

Across the 53 of 61 papers where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci37
  • cond-mat.mes-hall15
  • physics.app-ph7
  • physics.acc-ph1
  • quant-ph1
same name
  • Y. Ando — 262 papers, h 73
  • Y. Ando — 17 papers, h 49
  • Y. Ando — 7 papers, h 12
  • Y. Ando — 7 papers, h 19
  • Y. Ando — 3 papers, h 4
  • Y. Ando — 1 paper, h 47

Either other researchers who publish under this name, or the same person where the external sources have not merged their records.

identity via Semantic Scholar / OpenAlex

activity
20082026
most citedElectrical detection of the spin polarization due to charge flow in the surface state of the topological insulator Bi_1.5 Sb_0.5 Te_1.7 Se_1.3

164 citations · 1.9k across the 59 of their papers we have counts for

collaborators
Showing 2011 · cond-mat.mtrl-sciShow all

3 papers · 2 filters

cond-mat.mtrl-sci2011★ 33 cited

The effect of spin drift on spin accumulation voltages in highly-doped Si

Makoto Kameno, Eiji Shikoh, Teruya Shinjo +5

An investigation was carried out into the effect of spin drift on spin accumulation signals in highly-doped Si using non-local 4-terminal (NL-4T) and 3-terminal (NL-3T) methods. Th…

cond-mat.mtrl-sci2011★ 71 cited

Spin accumulation created electrically in an n-type germanium channel using Schottky tunnel contacts

K. Kasahara, Y. Baba, K. Yamane +6

Using high-quality Fe3​Si/n+-Ge Schottky-tunnel-barrier contacts, we study spin accumulation in an n-type germanium (n-Ge) channel. In the three- or two-terminal volta…

cond-mat.mtrl-sci2011★ 50 cited

Bias current dependence of spin accumulation signals in a silicon channel detected by a Schottky tunnel contact

Y. Ando, K. Kasahara, K. Yamane +6

We study the electrical detection of spin accumulation at a ferromagnet-silicon interface, which can be verified by measuring a Hanle effect in three-terminal lateral devices. The…

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