291 citations · 663 across the 14 of their papers we have counts for
14 papers
Tripling energy storage density through order-disorder transition induced polar nanoregions in PbZrO3 thin films by ion implantation
Yongjian Luo, Changan Wang, Chao Chen +19
Dielectric capacitors are widely used in pulsed power electronic devices due to their ultrahigh power densities and extremely fast charge/discharge speed. To achieve enhanced energ…
Microstructural Evolution of Charged Defects in the Fatigue Process of Polycrystalline BiFeO3 Thin Films
Qingqing Ke, Amit Kumar, Xiaojie Lou +4
Fatigue failure in ferroelectrics has been intensively investigated in the past few decades. Most of the mechanisms discussed for ferroelectric fatigue have been built on the "hypo…
Effect of polarization fatigue on the Rayleigh coefficients of ferroelectric lead zirconate titanate thin films: experimental evidence and implications
X. J. Lou, H. J. Zhang, Z. D. Luo +8
The effect of polarization fatigue on the Rayleigh coefficients of ferroelectric lead zirconate titanate (PZT) thin film was systematically investigated. It was found that electric…
Genuine driving voltage on polarization fatigue in (Pb,La)(Zr,Ti)O3 antiferroelectric thin films
Wenping Geng, Xiaojie Lou, Jianghong Xu +6
The polarization fatigue in (Pb0.97La0.02)(Zr0.95Ti0.05)O3 (PLZT) antiferroelectric thin films deposited onto silicon wafers is studied by investigating the effect of the peak/aver…
Effect of a built-in electric field in asymmetric ferroelectric tunnel junctions
Yang Liu, Xiaojie Lou, Manuel Bibes +1
The contribution of a built-in electric field to ferroelectric phase transition in asymmetric ferroelectric tunnel junctions is studied using a multiscale thermodynamic model. It i…
Origin of the Enhanced Polarization in La and Mg Co-substituted BiFeO3 Thin Film during the Fatigue Process
Qingqing Ke, Amit Kumar, Xiaojie Lou +2
We have studied the polarization fatigue of La and Mg co-substituted BiFeO3 thin film, where a polarization peak is observed during the fatigue process. The origin of such anomalou…