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researcher

N. Asadizanjani

7 papers hereh-index 10306 citations56 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • last author6

Across the 6 of 7 papers where every author was matched, so the position is known.

fields
  • cs.AR2
  • eess.IV2
  • cs.CY1
  • eess.SY1
  • physics.optics1

identity via Semantic Scholar / OpenAlex

most citedUS Microelectronics Packaging Ecosystem: Challenges and Opportunities

13 citations · 20 across the 7 of their papers we have counts for

collaborators
Showing eess.IVShow all

2 papers · 1 filter

eess.IV2026★ 1 cited

Design Guidelines for In-line X-ray Inspection in Advanced Packaging Technology: A CoWoS Case Study

Katayoon Yahyaei, M Shafkat M Khan, Guillermo Cadima +2

The shift towards advanced packaging technologies, including 2.5D and 3D integration, addresses the limitations of traditional methods while meeting increasing demands for performa…

eess.IV2023

In-Situ Thickness Measurement of Die Silicon Using Voltage Imaging for Hardware Assurance

Olivia P. Dizon-Paradis, Nitin Varshney, M Tanjidur Rahman +3

Hardware assurance of electronics is a challenging task and is of great interest to the government and the electronics industry. Physical inspection-based methods such as reverse e…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.