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cond-mat.mes-hall2022★ 33 cited
Controlled defect production in monolayer MoS2 via electron irradiation at ultralow accelerating voltages
Ajit Kumar Dash, Hariharan Swaminathan, Ethan Berger +7
Control on spatial location and density of defects in 2D materials can be achieved using electron beam irradiation. Conversely, ultralow accelerating voltages (less than or equal t…
physics.optics2022
Optical microscope based universal parameter for identifying layer number in two-dimensional materials
Mainak Mondal, Ajit Kumar Dash, Akshay Singh
Optical contrast is the most common preliminary method to identify layer number of two-dimensional (2D) materials, but is seldom used as a confirmatory technique. We explain the re…