37 citations · 88 across the 27 of their papers we have counts for
6 papers · 1 filter
Bivariate log-symmetric models: distributional properties, parameter estimation and an application to fatigue data analysis
Roberto Vila, Narayanaswamy Balakrishnan, Helton Saulo +1
The bivariate Gaussian distribution has been a key model for many developments in statistics. However, many real-world phenomena generate data that follow asymmetric distributions,…
Unit-log-symmetric models: Characterization, statistical properties and its use in analyzing internet access data
Roberto Vila, Narayanaswamy Balakrishnan, Helton Saulo +1
We present here a unit-log-symmetric model based on the bivariate log-symmetric distribution. It is a flexible family of distributions over the interval . We then discuss i…
Robust inference for intermittently-monitored step-stress tests under Weibull lifetime distributions
Narayanaswamy Balakrishnan, María Jaenada, Leandro Pardo
Many modern products exhibit high reliability under normal operating conditions. Conducting life tests under these conditions may result in very few observed failures, insufficient…
On Uncertainty of Dynamic Systems via State Aggregation Coarse-Graining and State Decomposition Fine-Graining Ways
Lirong Cui, Xiangchen Li, Narayanaswamy Balakrishnan
Uncertainty is an important feature of dynamic systems, and entropy has been widely used to measure this attribute. In this Letter, we prove that state aggregation and decompositio…
The restricted minimum density power divergence estimator for non-destructive one-shot device testing the under step-stress model with exponential lifetimes
Narayanaswamy Balakrishnan, María Jaenada, Leandro Pardo
One-shot devices data represent an extreme case of interval censoring.Some kind of one-shot units do not get destroyed when tested, and so, survival units can continue within the t…
Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
Narayanaswamy Balakrishnan, Elena Castilla, María Jaenada +1
One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of o…