2 papers
stat.AP2022
Robust estimation based on one-shot device test data under log-normal lifetimes
N. Balakrishnan, E. Castilla
In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also dev…
stat.AP2020
Divergence-based robust inference under proportional hazards model for one-shot device life-test
N. Balakrishnan, E. Castilla, N. Martin +1
In this paper, we develop robust estimators and tests for one-shot device testing under proportional hazards assumption based on divergence measures. Through a detailed Monte Carlo…