3 papers
stat.AP2022
Robust estimation based on one-shot device test data under log-normal lifetimes
N. Balakrishnan, E. Castilla
In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also dev…
stat.AP2020
Divergence-based robust inference under proportional hazards model for one-shot device life-test
N. Balakrishnan, E. Castilla, N. Martin +1
In this paper, we develop robust estimators and tests for one-shot device testing under proportional hazards assumption based on divergence measures. Through a detailed Monte Carlo…
math.ST2012
Pareto analysis based on records
M. Doostparast, N. Balakrishnan
Estimation of the parameters of an exponential distribution based on record data has been treated by Samaniego and Whitaker (1986) and Doostparast (2009). Recently, Doostparast and…