F. Golmar

most citedEvidence of defect-induced ferromagnetism in ZnFe

_{2}

_{4}

thin films

65 citations · 86 across the 2 of their papers we have counts for

collaborators

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cond-mat.mtrl-sci2011★ 65 cited

Evidence of defect-induced ferromagnetism in ZnFe $_{2}$ O $_{4}$ thin films

C. E. Rodríguez Torres, F. Golmar, M. Ziese +2

X-ray absorption near-edge and grazing incidence X-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFe $_{2}$ O $_{4}$ thin films. The spectrosc…

cond-mat.mtrl-sci2007★ 21 cited

Magnetic and structural study of Cu-doped TiO2 thin films

C. E. Rodríguez Torres, F. Golmar, A. F. Cabrera +5

Transparent pure and Cu-doped (2.5, 5 and 10 at. %) anatase TiO2 thin films were grown by pulsed laser deposition technique on LaAlO3 substrates. The samples were structurally char…

Evidence of defect-induced ferromagnetism in ZnFe2​O4​ thin films

Magnetic and structural study of Cu-doped TiO2 thin films

Evidence of defect-induced ferromagnetism in ZnFe $_{2}$ O $_{4}$ thin films