48 citations · 66 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2006★ 48 cited
Crosstalk Correction in Atomic Force Microscopy
A. Hoffmann, T. Jungk, E. Soergel
Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to mea…
cond-mat.mtrl-sci2006★ 18 cited
Impact of elasticity on the piezoresponse of adjacent ferroelectric domains investigated by scanning force microscopy
Tobias Jungk, Akos Hoffmann, Elisabeth Soergel
As a consequence of elasticity, mechanical deformations of crystals occur on a length scale comparable to their thickness. This is exemplified by applying a homogeneous electric fi…