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Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope
Steven M. Anlage, D. E. Steinhauer, C. P. Vlahacos +5
We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 m. The micros…
Frequency Following Imaging of Electric Fields from Resonant Superconducting Devices using a Scanning Near-Field Microwave Microscope
Ashfaq S. Thanawalla, B. J. Feenstra, Wensheng Hu +5
We have developed a scanning near-field microwave microscope that operates at cryogenic temperatures. Our system uses an open-ended coaxial probe with a 200 mm inner conductor diam…
Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions
B. J. Feenstra, C. P. Vlahacos, Ashfaq S. Thanawalla +4
We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two poss…