collaborators

6 papers

cond-mat.mtrl-sci2026

Scaling Nanoribbon Transistors with Monolayer Transition Metal Dichalcogenides

Tara Peña, Anton E. O. Persson, Andrey Krayev +13

Nanoscale transistors require aggressive reduction of all channel dimensions: length, width, and thickness. While monolayer two-dimensional semiconductors (2DS) offer ultimate thic…

cs.LG2025

Deep Learning to Automate Parameter Extraction and Model Fitting of Two-Dimensional Transistors

Robert K. A. Bennett, Jan-Lucas Uslu, Harmon F. Gault +8

We present a deep learning approach to extract physical parameters (e.g., mobility, Schottky contact barrier height, defect profiles) of two-dimensional (2D) transistors from elect…

cond-mat.mtrl-sci2025

Low Resistance P-type Contacts to Monolayer WSe through Chlorinated Solvent Doping

Lauren Hoang, Robert K. A. Bennett, Anh Tuan Hoang +7

Tungsten diselenide (WSe) is a promising p-type semiconductor limited by high contact resistance () and the lack of a reliable doping strategy. Here, we demonstra…

cond-mat.mtrl-sci2025

Synthesis-related nanoscale defects in Mo-based Janus monolayers revealed by cross-correlated AFM and TERS imaging

Tianyi Zhang, Andrey Krayev, Tilo H. Yang +14

Two-dimensional (2D) Janus transition metal dichalcogenides (TMDs) are promising candidates for various applications in non-linear optics, energy harvesting, and catalysis. These m…

physics.app-ph2025

Mobility and Threshold Voltage Extraction in Transistors with Gate-Voltage-Dependent Contact Resistance

Robert K. A. Bennett, Lauren Hoang, Connor Cremers +2

The mobility of emerging (e.g., two-dimensional, oxide, organic) semiconductors is commonly estimated from transistor current-voltage measurements. However, such devices often expe…

cond-mat.mtrl-sci2025

Resolving the Electron Plume within a Scanning Electron Microscope

Francis M. Alcorn, Christopher Perez, Eric J. Smoll +7

Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the num…