32 citations · 74 across the 10 of their papers we have counts for
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cs.LG2026
AI and TCAD for Inverse Design and Defect Discovery: From Simple Machine Learning to LLM
Hiu Yung Wong
AI has revolutionized various engineering domains, but its impact on semiconductor device design and defect discovery is still limited, due to limited data and the curse of dimensi…
cs.LG2023★ 5 cited
Device Image-IV Mapping using Variational Autoencoder for Inverse Design and Forward Prediction
Thomas Lu, Albert Lu, Hiu Yung Wong
This paper demonstrates the learning of the underlying device physics by mapping device structure images to their corresponding Current-Voltage (IV) characteristics using a novel f…
cs.LG2022★ 16 cited
Vertical GaN Diode BV Maximization through Rapid TCAD Simulation and ML-enabled Surrogate Model
Albert Lu, Jordan Marshall, Yifan Wang +3
In this paper, two methodologies are used to speed up the maximization of the breakdown volt-age (BV) of a vertical GaN diode that has a theoretical maximum BV of ~2100V. Firstly,…