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20142026
most citedCharacterization of process-related interfacial dielectric loss in aluminum-on-silicon by resonator microwave measurements, materials analysis, and imaging

12 citations · 12 across the 5 of their papers we have counts for

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cond-mat.mes-hall2014

Direct observation of the thickness distribution of ultra thin AlOx barrier in Al/AlOx/Al Josephson junctions

L. J. Zeng, S. Nik, T. Greibe +3

We show that less than 10% of the barrier area dominates the electron tunneling in state-of-art Al/AlOx/Al Josephson junctions. They have been studied by transmission electron micr…