most citedNanometer-Scale Materials Contrast Imaging with a Near-Field Microwave Microscope

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cond-mat.mtrl-sci2007★ 60 cited

Nanometer-Scale Materials Contrast Imaging with a Near-Field Microwave Microscope

Atif Imtiaz, Steven M. Anlage, John D. Barry +1

We report topography-free materials contrast imaging on a nano-fabricated Boron-doped Silicon sample measured with a Near-field Scanning Microwave Microscope over a broad frequency…