most citedOn the nature and charge state of the X-Defect, a radiation-induced Silicon defect with field-enhanced charge carrier emission

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physics.app-ph2023

Investigation of the Boron removal effect induced by 5.5 MeV electrons on highly doped EPI- and Cz-silicon

Chuan Liao, Eckhart Fretwurst, Erika Garutti +8

This study focuses on the properties of the BO (interstitial Boron~-~interstitial Oxygen) and CO (interstitial Carbon~-~interstitial Oxy…