3 citations · 5 across the 6 of their papers we have counts for
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Direct determination of antiferroelectric-to-ferroelectric phase transition pathways in PbZrO with Operando Electron Microscopy
Menglin Zhu, Michael Xu, Louis Alaerts +5
Under a sufficiently high applied electric field, a non-polar antiferroelectric material, such as \ce{PbZrO3}, can undergo a rapid transformation to a polar ferroelectric phase. Wh…
Operando Electron Microscopy of Nanoscale Electronic Devices on Non-Conductive Substrates
Menglin Zhu, Michael Xu, Zishen Tian +7
Achieving operating conditions comparable to ``bulk'' electronic devices, such as thin film capacitors, during \textit{operando} electron microscopy remains challenging, particular…
Sensitivity of Multislice Electron Ptychography to Point Defects: A Case Study in SiC
Aaditya Bhat, Colin Gilgenbach, Junghwa Kim +3
Here, we evaluate multislice electron ptychography as a tool to carry out depth-resolved atomic resolution characterization of point defects, using silicon carbide as a case study.…
Bridging experiment and theory of relaxor ferroelectrics at the atomic scale with multislice electron ptychography
Menglin Zhu, Michael Xu, Yubo Qi +7
Introducing structural and/or chemical heterogeneity into otherwise ordered crystals can dramatically alter material properties. Lead-based relaxor ferroelectrics are a prototypica…
Insights into Chemical and Structural Order at Planar Defects in a Functional Oxide Using Multislice Electron Ptychography
Menglin Zhu, Michael Xu, Yu Yun +7
Switchable order parameters in ferroic materials are essential for functional electronic devices, yet disruptions of the ordering can take the form of planar boundaries or defects…