606 citations · 830 across the 2 of their papers we have counts for
2 papers
cond-mat.mes-hall2009★ 224 cited
Tuning the electronic structure of graphene by ion irradiation
Levente Tapaszto, Gergely Dobrik, Peter Nemes-Incze +3
Mechanically exfoliated graphene layers deposited on SiO2 substrate were irradiated with Ar+ ions in order to experimentally study the effect of atomic scale defects and disorder o…
cond-mat.mes-hall2008★ 606 cited
Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy
P. Nemes-Incze, Z. Osvath, K. Kamaras +1
Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon…